Failure of device to self-test (Q60519): Difference between revisions
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Revision as of 08:01, 14 August 2026
Problem associated with the device failing to perform an internal self-diagnostic process to ensure normal operation during or prior to use.
| Language | Label | Description | Also known as |
|---|---|---|---|
| default for all languages | XE3V3 |
||
| English | Failure of device to self-test |
Problem associated with the device failing to perform an internal self-diagnostic process to ensure normal operation during or prior to use. |
Statements
CID11:XE3V3
0 references
dki-india-XE3V3
0 references
