Problem of device to self-test identified (Q57712): Difference between revisions
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Revision as of 05:20, 14 August 2026
Malfunction of the device's self-test system.
| Language | Label | Description | Also known as |
|---|---|---|---|
| default for all languages | XE7ZT |
||
| English | Problem of device to self-test identified |
Malfunction of the device's self-test system. |
Statements
CID11:XE7ZT
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dki-india-XE7ZT
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Concluído
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